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Synchronous Non-Volatile Logic Gate Design Based on Resistive Switching Memories.

Authors :
Zhao, Weisheng
Moreau, Mathieu
Deng, Erya
Zhang, Yue
Portal, Jean-Michel
Klein, Jacques-Olivier
Bocquet, Marc
Aziza, Hassen
Deleruyelle, Damien
Muller, Christophe
Querlioz, Damien
Ben Romdhane, Nesrine
Ravelosona, Dafine
Chappert, Claude
Source :
IEEE Transactions on Circuits & Systems. Part I: Regular Papers. Feb2014, Vol. 61 Issue 2, p443-454. 12p.
Publication Year :
2014

Abstract

Emerging non-volatile memories (NVM) based on resistive switching mechanism (RS) such as STT-MRAM, OxRRAM and CBRAM etc., are under intense R&D investigation by both academics and industries. They provide high write/read speed, low power and good endurance (e.g., >10^12) beyond mainstream NVMs, which allow them to be embedded directly with logic units for computing purpose. This integration could increase significantly the power/die area efficiency, and then overcome definitively the power/speed bottlenecks of modern VLSIs. This paper presents firstly a theoretical investigation of synchronous NV logic gates based on RS memories (RS-NVL). Special design techniques and strategies are proposed to optimize the structure according to different resistive characteristics of NVMs. To validate this study, we simulated a non-volatile full-adder (NVFA) with two types of NVMs: STT-MRAM and OxRRAM by using CMOS 40 nm design kit and compact models, which includes related physics and experimental parameters. They show interesting power, speed and area gain compared with synchronized CMOS FA while keeping good reliability. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
15498328
Volume :
61
Issue :
2
Database :
Academic Search Index
Journal :
IEEE Transactions on Circuits & Systems. Part I: Regular Papers
Publication Type :
Periodical
Accession number :
98013552
Full Text :
https://doi.org/10.1109/TCSI.2013.2278332