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Dynamic observation of Si (111) surface using a fast scanning tunneling microscope.
- Source :
-
Applied Physics Letters . 7/9/1990, Vol. 57 Issue 2, p138. 3p. - Publication Year :
- 1990
-
Abstract
- Atomic structures of a Si (111) surface are dynamically observed at a 2 s/frame velocity over a scanning field about 150 Å×150 Å using a fast scanning tunneling microscope (FSTM). A FSTM has been developed and it features a compensation method for probe tip servo position error in the constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation and tunnel current (Δ I/I) in differential-type tunnel current equation. The FSTM provides first dynamic observation of a residual gas molecule adsorption on atomic defects in 7×7 Si adatom reconstructions using a video tape recorder. In addition, a thermal drift of about 10 Å /s, about 30 min after direct electric flash heating of the sample for Si surface cleaning, can be easily observed. [ABSTRACT FROM AUTHOR]
- Subjects :
- *SURFACES (Technology)
*ATOMIC structure
*SCANNING tunneling microscopy
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 57
- Issue :
- 2
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 9834378
- Full Text :
- https://doi.org/10.1063/1.103965