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Improved broadband antireflection in Schottky-like junction of conformal Al-doped ZnO layer on chemically textured Si surfaces.
- Source :
-
Applied Physics Letters . 9/22/2014, Vol. 105 Issue 12, p1-4. 4p. 4 Graphs. - Publication Year :
- 2014
-
Abstract
- Chemically textured Si with improved absorption in the complete range of solar spectrum is investigated by ultraviolet/visible/near-infrared (UV/Vis/NIR) spectroscopy, showing an average specular reflectance of ~0.4% in the wavelength of 500-3000nm. The pyramidal structures on such solar-blind Si can reduce the reflectance further below 0.1% in the UV region by conformal growth of granular Al-doped ZnO (AZO) films. X-ray diffraction analyses suggest the growth of polycrystalline AZO on faceted-Si. Moreover, marginal increase in electrical conductivity of AZO is found on textured surfaces, whereas rise in leakage current in Schottky-like Ag/AZO/Si/Ag heterostructure devices is noticed with increasing Si surface area. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 105
- Issue :
- 12
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 98606768
- Full Text :
- https://doi.org/10.1063/1.4896340