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Probability Models for Open Set Recognition.

Authors :
Scheirer, Walter J.
Jain, Lalit P.
Boult, Terrance E.
Source :
IEEE Transactions on Pattern Analysis & Machine Intelligence. Nov2014, Vol. 36 Issue 11, p2317-2324. 8p.
Publication Year :
2014

Abstract

Real-world tasks in computer vision often touch upon open set recognition: multi-class recognition with incomplete knowledge of the world and many unknown inputs. Recent work on this problem has proposed a model incorporating an open space risk term to account for the space beyond the reasonable support of known classes. This paper extends the general idea of open space risk limiting classification to accommodate non-linear classifiers in a multi-class setting. We introduce a new open set recognition model called compact abating probability (CAP), where the probability of class membership decreases in value (abates) as points move from known data toward open space. We show that CAP models improve open set recognition for multiple algorithms. Leveraging the CAP formulation, we go on to describe the novel Weibull-calibrated SVM (W-SVM) algorithm, which combines the useful properties of statistical extreme value theory for score calibration with one-class and binary support vector machines. Our experiments show that the W-SVM is significantly better for open set object detection and OCR problems when compared to the state-of-the-art for the same tasks. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
01628828
Volume :
36
Issue :
11
Database :
Academic Search Index
Journal :
IEEE Transactions on Pattern Analysis & Machine Intelligence
Publication Type :
Academic Journal
Accession number :
98708091
Full Text :
https://doi.org/10.1109/TPAMI.2014.2321392