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VLSI symposium eyes 65-nm logic.

Authors :
Lammers, David
Source :
Electronic Engineering Times (01921541). 5/26/2003, Issue 1271, p20. 2p.
Publication Year :
2003

Abstract

Reports on 65-nanometer technology demonstrations and papers that will be presented at the 2003 VLSI Technology Symposium in June 10-12, 2003, in Kyoto, Japan. Toshiba-Sony paper describing an embedded SRAM technology at 65-nm line widths that achieves a cell size of 0.56 square micron; Motorola-Philips-ST team's presentation of its 65-nm complementary metal oxide semiconductors integration strategy.

Details

Language :
English
ISSN :
01921541
Issue :
1271
Database :
Academic Search Index
Journal :
Electronic Engineering Times (01921541)
Publication Type :
Periodical
Accession number :
9896607