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VLSI symposium eyes 65-nm logic.
- Source :
-
Electronic Engineering Times (01921541) . 5/26/2003, Issue 1271, p20. 2p. - Publication Year :
- 2003
-
Abstract
- Reports on 65-nanometer technology demonstrations and papers that will be presented at the 2003 VLSI Technology Symposium in June 10-12, 2003, in Kyoto, Japan. Toshiba-Sony paper describing an embedded SRAM technology at 65-nm line widths that achieves a cell size of 0.56 square micron; Motorola-Philips-ST team's presentation of its 65-nm complementary metal oxide semiconductors integration strategy.
- Subjects :
- *NANOTECHNOLOGY conferences
*CONFERENCES & conventions
Subjects
Details
- Language :
- English
- ISSN :
- 01921541
- Issue :
- 1271
- Database :
- Academic Search Index
- Journal :
- Electronic Engineering Times (01921541)
- Publication Type :
- Periodical
- Accession number :
- 9896607