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Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry.
- Source :
-
Applied Physics Letters . 11/17/2014, Vol. 105 Issue 20, p1-4. 4p. 1 Color Photograph, 2 Charts, 3 Graphs. - Publication Year :
- 2014
-
Abstract
- Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices. [ABSTRACT FROM AUTHOR]
- Subjects :
- *ELLIPSOMETRY
*CHEMICAL vapor deposition
*OPTOELECTRONICS
*ABSORPTION
*SPINTRONICS
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 105
- Issue :
- 20
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 99609337
- Full Text :
- https://doi.org/10.1063/1.4901836