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Effect of film stress on electrochemical properties of lithium manganese oxide thin films
- Source :
-
Journal of Power Sources . Jun2003, Vol. 119-121, p710. 3p. - Publication Year :
- 2003
-
Abstract
- Using radio frequency magnetron sputtering, we fabricated spinel-phase LiMn2O4 films with different thicknesses. The stress state of the 200 nm-thick films maintained the compressive stress and that of the 400 nm-thick films changed from compressive to tensile stress during annealing. During the cycle test, the amount of volume change in the 400 nm-thick films was larger than that in the 200 nm-thick films. In the case of the 400 nm-thick, micro-cracks on the surface were generated during the cycle test and this phenomenon caused the stress transition and also a harmful effect on the cycle retention of the cathode thin films. [Copyright &y& Elsevier]
- Subjects :
- *THICK films
*STRAINS & stresses (Mechanics)
Subjects
Details
- Language :
- English
- ISSN :
- 03787753
- Volume :
- 119-121
- Database :
- Academic Search Index
- Journal :
- Journal of Power Sources
- Publication Type :
- Academic Journal
- Accession number :
- 9991187
- Full Text :
- https://doi.org/10.1016/S0378-7753(03)00219-2