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X-ray scattering study of Ag/Si(111) buried interface structures.

Authors :
Hong H
Aburano RD
Lin D
Chen H
Chiang T
Zschack P
Specht ED
Source :
Physical review letters [Phys Rev Lett] 1992 Jan 27; Vol. 68 (4), pp. 507-510.
Publication Year :
1992

Details

Language :
English
ISSN :
1079-7114
Volume :
68
Issue :
4
Database :
MEDLINE
Journal :
Physical review letters
Publication Type :
Academic Journal
Accession number :
10045914
Full Text :
https://doi.org/10.1103/PhysRevLett.68.507