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Elemental mapping using the Ga 3d and In 4d transitions in the epsilon2 absorption spectra derived from EELS.

Authors :
Gass MH
Papworth AJ
Bullough TJ
Chalker PR
Source :
Ultramicroscopy [Ultramicroscopy] 2004 Nov; Vol. 101 (2-4), pp. 257-64.
Publication Year :
2004

Abstract

It is proposed that by using the valence-band states in electron energy loss spectroscopy, high-spatial resolution maps of quantitative elemental composition may be acquired with high acquisition rates. Further, it is shown that by using the epsilon(2) spectrum instead of single scattering data, the noise in the observed transitions and associated maps is significantly reduced. The epsilon(2) spectra are derived through a Kramers-Kronig transformation from electron energy loss spectra obtained in a scanning transmission electron microscope. Using transitions that occur in the epsilon(2) absorption spectrum (<40eV), quantitative elemental maps for III-V device structures have been produced. An example is provided using the Ga 3d transition to map a GaInNAs/GaAs laser structure. Weaker transitions such as In 4d have also been used to verify the Ga elemental distribution.

Details

Language :
English
ISSN :
0304-3991
Volume :
101
Issue :
2-4
Database :
MEDLINE
Journal :
Ultramicroscopy
Publication Type :
Academic Journal
Accession number :
15450671
Full Text :
https://doi.org/10.1016/j.ultramic.2004.06.007