Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopy.

Authors :: Watanabe K
Kikuchi Y
Yamazaki T
Asano E
Nakanishi N
Kotaka Y
Okunishi E
Hashimoto I
Source :: Acta crystallographica. Section A, Foundations of crystallography [Acta Crystallogr A] 2004 Nov; Vol. 60 (Pt 6), pp. 591-7. Date of Electronic Publication: 2004 Oct 26.
Publication Year :: 2004
Abstract: Atomic resolution low-angle bright-field (LABF) scanning transmission electron-microscope (STEM) images and high-angle bright-field (HABF) STEM images of [011]-orientated Si have been experimentally obtained together with high-angle annular dark-field (HAADF) STEM images. The contrast formation mechanisms of the LABF STEM and HABF STEM images are examined in comparison with HAADF STEM images. The HABF STEM images independent of defocus and thickness have spatial resolution comparable with HAADF STEM images, and are shown to be given as a simple convolution under the non-dispersion approximation of localized Bloch waves.

Language :: English
ISSN :: 0108-7673
Volume :: 60
Issue :: Pt 6
Database :: MEDLINE
Journal :: Acta crystallographica. Section A, Foundations of crystallography
Publication Type :: Academic Journal
Accession number :: 15507742
Full Text :: https://doi.org/10.1107/S0108767304020288

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