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Electrical resistance of a monatomic step on a crystal surface.

Authors :
Matsuda I
Ueno M
Hirahara T
Hobara R
Morikawa H
Liu C
Hasegawa S
Source :
Physical review letters [Phys Rev Lett] 2004 Dec 03; Vol. 93 (23), pp. 236801. Date of Electronic Publication: 2004 Nov 29.
Publication Year :
2004

Abstract

We have succeeded in measuring the resistance across a single atomic step through a monatomic-layer metal on a crystal surface, Si(111)(sqrt[3]xsqrt[3])-Ag, using three independent methods, which yielded consistent values of the resistance. Two of the methods were direct measurements with monolithic microscopic four-point probes and four-tip scanning tunneling microscope probes. The third method was the analysis of electron standing waves near step edges, combined with the Landauer formula for 2D conductors. The conductivity across a monatomic step was determined to be about 5 x 10(3) Omega(-1) m(-1). Electron transport across an atomic step is modeled as a tunneling process through an energy-barrier height approximately equal to the work function.

Details

Language :
English
ISSN :
0031-9007
Volume :
93
Issue :
23
Database :
MEDLINE
Journal :
Physical review letters
Publication Type :
Academic Journal
Accession number :
15601184
Full Text :
https://doi.org/10.1103/PhysRevLett.93.236801