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Interferometric measurement of the temperature dependence of an index of refraction: application to fused silica.
- Source :
-
Applied optics [Appl Opt] 2010 Feb 01; Vol. 49 (4), pp. 678-82. - Publication Year :
- 2010
-
Abstract
- The light reflected by an uncoated Fabry-Perot etalon presents dark rings which give a very sensitive measurement of the variations of the return optical path in the etalon. By measuring the diameters of these rings as a function of the etalon temperature T, we get a sensitive measurement of the derivative dn/dT of the index of refraction n. We have made this experiment with a fused silica etalon and we have achieved a 2% relative uncertainty on dn/dT, comparable to the uncertainty of the best experiments.
Details
- Language :
- English
- ISSN :
- 1539-4522
- Volume :
- 49
- Issue :
- 4
- Database :
- MEDLINE
- Journal :
- Applied optics
- Publication Type :
- Academic Journal
- Accession number :
- 20119019
- Full Text :
- https://doi.org/10.1364/AO.49.000678