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Corrigendum: Dark-field X-ray microscopy for multiscale structural characterization.

Authors :
Simons H
King A
Ludwig W
Detlefs C
Pantleon W
Schmidt S
Stöhr F
Snigireva I
Snigirev A
Poulsen HF
Source :
Nature communications [Nat Commun] 2015 Mar 05; Vol. 6, pp. 6612. Date of Electronic Publication: 2015 Mar 05.
Publication Year :
2015

Details

Language :
English
ISSN :
2041-1723
Volume :
6
Database :
MEDLINE
Journal :
Nature communications
Accession number :
25739984
Full Text :
https://doi.org/10.1038/ncomms7612
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