Charged particle flows in the beam extraction region of a negative ion source for NBI.

MLA

Geng, S., et al. “Charged Particle Flows in the Beam Extraction Region of a Negative Ion Source for NBI.” The Review of Scientific Instruments, vol. 87, no. 2, Feb. 2016, p. 02B103. EBSCOhost, https://doi.org/10.1063/1.4931796.

APA

Geng, S., Tsumori, K., Nakano, H., Kisaki, M., Ikeda, K., Osakabe, M., Nagaoka, K., Takeiri, Y., Shibuya, M., & Kaneko, O. (2016). Charged particle flows in the beam extraction region of a negative ion source for NBI. The Review of Scientific Instruments, 87(2), 02B103. https://doi.org/10.1063/1.4931796

Chicago

Geng, S, K Tsumori, H Nakano, M Kisaki, K Ikeda, M Osakabe, K Nagaoka, Y Takeiri, M Shibuya, and O Kaneko. 2016. “Charged Particle Flows in the Beam Extraction Region of a Negative Ion Source for NBI.” The Review of Scientific Instruments 87 (2): 02B103. doi:10.1063/1.4931796.