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Elimination of charge carrier trapping in diluted semiconductors.
- Source :
-
Nature materials [Nat Mater] 2016 Jun; Vol. 15 (6), pp. 628-33. Date of Electronic Publication: 2016 Apr 25. - Publication Year :
- 2016
-
Abstract
- In 1962, Mark and Helfrich demonstrated that the current in a semiconductor containing traps is reduced by N/Nt(r), with N the amount of transport sites, Nt the amount of traps and r a number that depends on the trap energy distribution. For r > 1, the possibility opens that trapping effects can be nearly eliminated when N and Nt are simultaneously reduced. Solution-processed conjugated polymers are an excellent model system to test this hypothesis, because they can be easily diluted by blending them with a high-bandgap semiconductor. We demonstrate that in conjugated polymer blends with 10% active semiconductor and 90% high-bandgap host, the typical strong electron trapping can be effectively eliminated. As a result we were able to fabricate polymer light-emitting diodes with balanced electron and hole transport and reduced non-radiative trap-assisted recombination, leading to a doubling of their efficiency at nearly ten times lower material costs.
Details
- Language :
- English
- ISSN :
- 1476-4660
- Volume :
- 15
- Issue :
- 6
- Database :
- MEDLINE
- Journal :
- Nature materials
- Publication Type :
- Academic Journal
- Accession number :
- 27111412
- Full Text :
- https://doi.org/10.1038/nmat4626