Intrinsic stability of ferroelectric and piezoelectric properties of epitaxial PbZr 0.45 Ti 0.55 O 3 thin films on silicon in relation to grain tilt.

MLA

Houwman, Evert P., et al. “Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr 0.45 Ti 0.55 O 3 Thin Films on Silicon in Relation to Grain Tilt.” Science and Technology of Advanced Materials, vol. 14, no. 4, July 2013, p. 045006. EBSCOhost, https://doi.org/10.1088/1468-6996/14/4/045006.

APA

Houwman, E. P., Nguyen, M. D., Dekkers, M., & Rijnders, G. (2013). Intrinsic stability of ferroelectric and piezoelectric properties of epitaxial PbZr 0.45 Ti 0.55 O 3 thin films on silicon in relation to grain tilt. Science and Technology of Advanced Materials, 14(4), 045006. https://doi.org/10.1088/1468-6996/14/4/045006

Chicago

Houwman, Evert P, Minh D Nguyen, Matthijn Dekkers, and Guus Rijnders. 2013. “Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr 0.45 Ti 0.55 O 3 Thin Films on Silicon in Relation to Grain Tilt.” Science and Technology of Advanced Materials 14 (4): 045006. doi:10.1088/1468-6996/14/4/045006.