Preservation of Surface Conductivity and Dielectric Loss Tangent in Large-Scale, Encapsulated Epitaxial Graphene Measured by Noncontact Microwave Cavity Perturbations.

MLA

Rigosi, Albert F., et al. “Preservation of Surface Conductivity and Dielectric Loss Tangent in Large-Scale, Encapsulated Epitaxial Graphene Measured by Noncontact Microwave Cavity Perturbations.” Small (Weinheim an Der Bergstrasse, Germany), vol. 13, no. 26, July 2017. EBSCOhost, https://doi.org/10.1002/smll.201700452.

APA

Rigosi, A. F., Glavin, N. R., Liu, C.-I., Yang, Y., Obrzut, J., Hill, H. M., Hu, J., Lee, H.-Y., Hight Walker, A. R., Richter, C. A., Elmquist, R. E., & Newell, D. B. (2017). Preservation of Surface Conductivity and Dielectric Loss Tangent in Large-Scale, Encapsulated Epitaxial Graphene Measured by Noncontact Microwave Cavity Perturbations. Small (Weinheim an Der Bergstrasse, Germany), 13(26). https://doi.org/10.1002/smll.201700452

Chicago

Rigosi, Albert F, Nicholas R Glavin, Chieh-I Liu, Yanfei Yang, Jan Obrzut, Heather M Hill, Jiuning Hu, et al. 2017. “Preservation of Surface Conductivity and Dielectric Loss Tangent in Large-Scale, Encapsulated Epitaxial Graphene Measured by Noncontact Microwave Cavity Perturbations.” Small (Weinheim an Der Bergstrasse, Germany) 13 (26). doi:10.1002/smll.201700452.