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Associations between ECG changes and echocardiographic findings in patients with acute non-ST elevation myocardial infarction.
- Source :
-
Journal of electrocardiology [J Electrocardiol] 2018 Mar - Apr; Vol. 51 (2), pp. 188-194. Date of Electronic Publication: 2017 Nov 21. - Publication Year :
- 2018
-
Abstract
- Background: ST segment depression (STD) and T wave inversion (TWI) are typical electrocardiographic (ECG) findings in non-ST elevation myocardial infarction (NSTEMI). In ST elevation myocardial infarction, ST changes represent transmural ischemia. The pathophysiological mechanisms of the ECG changes in NSTEMI are unclear.<br />Purpose: We studied the associations between ECG and the echocardiographic findings in NSTEMI patients.<br />Methods: Twenty patients with acute NSTEMI were recruited during their hospital stay. A comprehensive echocardiography study was performed. The findings were compared with blinded ECG analyses.<br />Results: Nine (45%) patients had STD, and 16 (85%) patients had TWI. In multivariable analysis, STD was independently associated with a lower global early diastolic strain rate (β=-5.061, p=0.033). TWI was independently associated with lower circumferential strain (β=0.132, p=0.032).<br />Conclusions: The typical ECG changes in NSTEMI patients were associated with subtle echocardiographic changes. STD was related to changes in diastolic function, and TWI was associated with systolic deterioration.<br /> (Copyright © 2017 Elsevier Inc. All rights reserved.)
- Subjects :
- Diastole physiology
Female
Humans
Male
Middle Aged
Systole physiology
Ventricular Dysfunction, Left diagnostic imaging
Ventricular Dysfunction, Left physiopathology
Echocardiography
Electrocardiography
Non-ST Elevated Myocardial Infarction diagnostic imaging
Non-ST Elevated Myocardial Infarction physiopathology
Subjects
Details
- Language :
- English
- ISSN :
- 1532-8430
- Volume :
- 51
- Issue :
- 2
- Database :
- MEDLINE
- Journal :
- Journal of electrocardiology
- Publication Type :
- Academic Journal
- Accession number :
- 29174705
- Full Text :
- https://doi.org/10.1016/j.jelectrocard.2017.11.007