High-resolution mapping of rachis nodes per rachis, a critical determinant of grain yield components in wheat.

MLA

Voss-Fels, Kai P., et al. “High-Resolution Mapping of Rachis Nodes per Rachis, a Critical Determinant of Grain Yield Components in Wheat.” TAG. Theoretical and Applied Genetics. Theoretische Und Angewandte Genetik, vol. 132, no. 9, Sept. 2019, pp. 2707–19. EBSCOhost, https://doi.org/10.1007/s00122-019-03383-4.

APA

Voss-Fels, K. P., Keeble-Gagnère, G., Hickey, L. T., Tibbits, J., Nagornyy, S., Hayden, M. J., Pasam, R. K., Kant, S., Friedt, W., Snowdon, R. J., Appels, R., & Wittkop, B. (2019). High-resolution mapping of rachis nodes per rachis, a critical determinant of grain yield components in wheat. TAG. Theoretical and Applied Genetics. Theoretische Und Angewandte Genetik, 132(9), 2707–2719. https://doi.org/10.1007/s00122-019-03383-4

Chicago

Voss-Fels, Kai P, Gabriel Keeble-Gagnère, Lee T Hickey, Josquin Tibbits, Sergej Nagornyy, Matthew J Hayden, Raj K Pasam, et al. 2019. “High-Resolution Mapping of Rachis Nodes per Rachis, a Critical Determinant of Grain Yield Components in Wheat.” TAG. Theoretical and Applied Genetics. Theoretische Und Angewandte Genetik 132 (9): 2707–19. doi:10.1007/s00122-019-03383-4.