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Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry.
- Source :
-
IEEE transactions on electron devices [IEEE Trans Electron Devices] 2019; Vol. 66 (9). - Publication Year :
- 2019
-
Abstract
- In this paper, we show that quantum Hall resistance measurements using two terminals may be as precise as four-terminal measurements when applying superconducting split contacts. The described sample designs eliminate resistance contributions of terminals and contacts such that the size and complexity of next-generation quantized Hall resistance devices can be significantly improved.
Details
- Language :
- English
- ISSN :
- 0018-9383
- Volume :
- 66
- Issue :
- 9
- Database :
- MEDLINE
- Journal :
- IEEE transactions on electron devices
- Publication Type :
- Academic Journal
- Accession number :
- 32116346
- Full Text :
- https://doi.org/10.1109/ted.2019.2926684