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Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry.

Authors :
Kruskopf M
Rigosi AF
Panna AR
Patel DK
Jin H
Marzano M
Berilla M
Newell DB
Elmquist RE
Source :
IEEE transactions on electron devices [IEEE Trans Electron Devices] 2019; Vol. 66 (9).
Publication Year :
2019

Abstract

In this paper, we show that quantum Hall resistance measurements using two terminals may be as precise as four-terminal measurements when applying superconducting split contacts. The described sample designs eliminate resistance contributions of terminals and contacts such that the size and complexity of next-generation quantized Hall resistance devices can be significantly improved.

Details

Language :
English
ISSN :
0018-9383
Volume :
66
Issue :
9
Database :
MEDLINE
Journal :
IEEE transactions on electron devices
Publication Type :
Academic Journal
Accession number :
32116346
Full Text :
https://doi.org/10.1109/ted.2019.2926684