Intrinsic Dielectric Loss in Zr 0.8 Sn 0.2 TiO 4 Ceramics Investigated by Terahertz Time Domain Spectroscopy.

Terahertz time-domain spectroscopy (THz-TDS) was employed for estimation of intrinsic dielectric loss of Zr _0.8 Sn _0.2 TiO ₄ (ZST) ceramics. Single-phase ZST dielectric resonators (DRs) with various synthesis parameters and, consequently, different extrinsic losses, were prepared by conventional ceramic technology. Even though the DRs exhibit a similar microstructure, their quality factor ( Q is the inverse of dielectric loss tangent) measured in microwave (MW) domain at 6 GHz varies between 2500 and 8400. On the other hand, it was found that the THz dielectric loss is less sensitive to the sample preparation. The intrinsic losses ( Q × f ~60 THz) of the ZST ceramics have been derived from THz data.