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In situ studies on defect formation dynamics in flash-sintered TiO 2 .

Authors :
Xue S
Li Phuah X
Jian J
Li Q
Li J
Yang B
Zhang D
Wang H
Tsakalakos T
Mukherjee AK
Wang H
Zhang X
Source :
Nanoscale [Nanoscale] 2023 Oct 26; Vol. 15 (41), pp. 16752-16765. Date of Electronic Publication: 2023 Oct 26.
Publication Year :
2023

Abstract

Flash-sintered (FS) ceramics have shown promising mechanical deformability at room temperature compared to conventional sintered ceramics. One major contributing factor to plasticity is high-density defects, such as dislocations, stacking faults and point defects, resulted presumably from the high electrical field during flash sintering. However, such direct experiemtnal evidence for defect formation and evolution under the electric field remains lacking. Here we performed in situ biasing experiments in FS and conventionally sintered (CS) polycrystalline TiO <subscript>2</subscript> in a transmission electron microscope (TEM) to compare the defect evolution dynamics. In situ TEM studies revealed the coalescence of point defects under the electrical field in both FS and CS TiO <subscript>2</subscript> and the subsequent formation of stacking faults, which are often referred to as Wadsley defects. Surprisingly, under the electrical field, the average fault growth rate in the FS samples is 10 times as much as that in the CS TiO <subscript>2</subscript> . Furthermore, the Magnéli phase, a 3D oxygen-deficient phase formed by the aggregation of Wadsley defects, is observed in the FS samples, but not in the CS samples. The present study provides new insights into defect dynamics in FS ceramics.

Details

Language :
English
ISSN :
2040-3372
Volume :
15
Issue :
41
Database :
MEDLINE
Journal :
Nanoscale
Publication Type :
Academic Journal
Accession number :
37817681
Full Text :
https://doi.org/10.1039/d3nr02630b