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Equivalent-Circuit Analysis for the Electroluminescence-Efficiency Problem of InGaN/GaN Light-Emitting Diodes.
- Source :
- Japanese Journal of Applied Physics; Apr2008, Vol. 47 Issue 4R, p1-1, 1p
- Publication Year :
- 2008
-
Abstract
- Electroluminescence (EL) efficiency of the InGaN-based light-emitting diode (LED) is the present subject of discussion. An equivalent circuit model was introduced to treat explicitly four independent current components: leakage, radiative, nonradiative, and carrier overflow. This model was used to explain the internal quantum efficiency (IQE) as a function of current, temperature, and material quality. In the low-current range, efficiency became strongly dependent on temperature as leakage and nonradiative recombination currents related to material quality shared a large part of the total current. In the high-current range, the reduced efficiency was explained by electron-overflow current. Electron-overflow current was increased by reducing temperature via freeze-out of holes. When leakage current and carrier overflow were suppressed effectively in the intermediate current range on high-quality devices, hole freeze-out was observed experimentally in electroluminescence intensity as temperature was varied. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00214922
- Volume :
- 47
- Issue :
- 4R
- Database :
- Complementary Index
- Journal :
- Japanese Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 100162284
- Full Text :
- https://doi.org/10.1143/JJAP.47.2112