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Equivalent-Circuit Analysis for the Electroluminescence-Efficiency Problem of InGaN/GaN Light-Emitting Diodes.

Authors :
Masui, Hisashi
Ive, Tommy
Schmidt, Mathew C.
Fellows, Natalie N.
Sato, Hitoshi
Asamizu, Hirokuni
Nakamura, Shuji
DenBaars, Steven P.
Source :
Japanese Journal of Applied Physics; Apr2008, Vol. 47 Issue 4R, p1-1, 1p
Publication Year :
2008

Abstract

Electroluminescence (EL) efficiency of the InGaN-based light-emitting diode (LED) is the present subject of discussion. An equivalent circuit model was introduced to treat explicitly four independent current components: leakage, radiative, nonradiative, and carrier overflow. This model was used to explain the internal quantum efficiency (IQE) as a function of current, temperature, and material quality. In the low-current range, efficiency became strongly dependent on temperature as leakage and nonradiative recombination currents related to material quality shared a large part of the total current. In the high-current range, the reduced efficiency was explained by electron-overflow current. Electron-overflow current was increased by reducing temperature via freeze-out of holes. When leakage current and carrier overflow were suppressed effectively in the intermediate current range on high-quality devices, hole freeze-out was observed experimentally in electroluminescence intensity as temperature was varied. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00214922
Volume :
47
Issue :
4R
Database :
Complementary Index
Journal :
Japanese Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
100162284
Full Text :
https://doi.org/10.1143/JJAP.47.2112