Primary Factor Extracted for Anomalous Decline of Drain Current in Metal–Oxide–Semiconductor Field-Effect Transistors.

MLA

Abe, Kazuhide, et al. “Primary Factor Extracted for Anomalous Decline of Drain Current in Metal–Oxide–Semiconductor Field-Effect Transistors.” Japanese Journal of Applied Physics, vol. 51, no. 5R, May 2012, p. 1. EBSCOhost, https://doi.org/10.1143/JJAP.51.050205.

APA

Abe, K., Sasaki, T., & Itaya, K. (2012). Primary Factor Extracted for Anomalous Decline of Drain Current in Metal–Oxide–Semiconductor Field-Effect Transistors. Japanese Journal of Applied Physics, 51(5R), 1. https://doi.org/10.1143/JJAP.51.050205

Chicago

Abe, Kazuhide, Tadahiro Sasaki, and Kazuhiko Itaya. 2012. “Primary Factor Extracted for Anomalous Decline of Drain Current in Metal–Oxide–Semiconductor Field-Effect Transistors.” Japanese Journal of Applied Physics 51 (5R): 1. doi:10.1143/JJAP.51.050205.