Structural characterization of undoped and Sb-doped SnO[sub2] thin films at different temperatures.

Reports on SnO[sub 2] thin films obtained by the sol-gel method starting from inorganic precursor solutions. Comparison of the undoped and Sb-doped SnO[sub 2] films prepared by dip-coating; Characterization of the porous nanostructure by grazing incidence small-angle X-ray scattering; Use of X-ray reflectivity to determine the density and the thickness of the films.