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Using the inter- and intra-switch regularity in NoC switch testing.

Authors :
Hosseinabady, Mohammad
Dalirsani, Atefe
Navabi, Zainalabedin
Source :
Proceedings of the Conference: Design, Automation & Test in Europe; 4/16/2007, p361-366, 6p
Publication Year :
2007

Details

Language :
English
Database :
Complementary Index
Journal :
Proceedings of the Conference: Design, Automation & Test in Europe
Publication Type :
Conference
Accession number :
101095363