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A set-based mapping strategy for flash-memory reliability enhancement.

Authors :
Chu, Yuan-Sheng
Hsieh, Jen-Wei
Chang, Yuan-Hao
Kuo, Tei-Wei
Source :
Proceedings of the Conference: Design, Automation & Test in Europe; 4/20/2009, p405-410, 6p
Publication Year :
2009

Details

Language :
English
Database :
Complementary Index
Journal :
Proceedings of the Conference: Design, Automation & Test in Europe
Publication Type :
Conference
Accession number :
101095953