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RALF: reliability analysis for logic faults.

Authors :
Luckenbill, Samuel
Lee, Ju-Yueh
Hu, Yu
Majumdar, Rupak
He, Lei
Source :
Proceedings of the Conference: Design, Automation & Test in Europe; 3/8/2010, p783-788, 6p
Publication Year :
2010

Details

Language :
English
Database :
Complementary Index
Journal :
Proceedings of the Conference: Design, Automation & Test in Europe
Publication Type :
Conference
Accession number :
101096345