Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity.

MLA

Bastos, Rodrigo Possamai, et al. “Comparison of Bulk Built-in Current Sensors in Terms of Transient-Fault Detection Sensitivity.” 2014 5th European Workshop on CMOS Variability (VARI), Jan. 2014, pp. 1–6. EBSCOhost, https://doi.org/10.1109/VARI.2014.6957089.

APA

Bastos, R. P., Dutertre, J.-M., & Torres, F. S. (2014). Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity. 2014 5th European Workshop on CMOS Variability (VARI), 1–6. https://doi.org/10.1109/VARI.2014.6957089

Chicago

Bastos, Rodrigo Possamai, Jean-Max Dutertre, and Frank Sill Torres. 2014. “Comparison of Bulk Built-in Current Sensors in Terms of Transient-Fault Detection Sensitivity.” 2014 5th European Workshop on CMOS Variability (VARI), January, 1–6. doi:10.1109/VARI.2014.6957089.