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ELDRS Characterization of Texas Instruments LM185, 1.2V Precision Reference: Retrograde Behavior Demonstrates Why Taking Interim Test Points Is Important.

Authors :
Kruckmeyer, Kirby
Trinh, Thang
Source :
2014 IEEE Radiation Effects Data Workshop (REDW); 2014, p1-4, 4p
Publication Year :
2014

Details

Language :
English
ISBNs :
9781479958832
Database :
Complementary Index
Journal :
2014 IEEE Radiation Effects Data Workshop (REDW)
Publication Type :
Conference
Accession number :
101277711
Full Text :
https://doi.org/10.1109/REDW.2014.7004567