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Structural phase transition of ternary dielectric SmGdO3: Evidence from angle dispersive x-ray diffraction and Raman spectroscopic studies.
- Source :
- Journal of Applied Physics; 2015, Vol. 117 Issue 9, p094101-1-094101-5, 5p, 1 Chart, 4 Graphs
- Publication Year :
- 2015
-
Abstract
- High-pressure synchrotron based angle dispersive x-ray diffraction (ADXRD) studies were carried out on SmGdO<subscript>3</subscript> (SGO) up to 25.7 GPa at room temperature. ADXRD results indicated a reversible pressure-induced phase transition from ambient monoclinic to hexagonal phase at ∼8.9 GPa. The observed pressure-volume data were fitted with the third order Birch-Murnaghan equation of state yielding zero pressure bulk modulus B<subscript>o</subscript>=132(22) and 177(9) GPa for monoclinic (B-type) and hexagonal (A-type) phases, respectively. Pressure dependent micro-Raman spectroscopy further confirmed the monoclinic to hexagonal phase transition at about 5.24 GPa. The mode Grüneisen parameters and pressure coefficients for different Raman modes corresponding to each individual phases of SGO were calculated using pressure dependent Raman mode analysis. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 117
- Issue :
- 9
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 101441734
- Full Text :
- https://doi.org/10.1063/1.4913776