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A scalable quantitative measure of IR-drop effects for scan pattern generation.

Authors :
Wu, M.-F.
Tsai, Kun-Han
Cheng, Wu-Tung
Pan, H.-C.
Huang, Jiun-Lang
Kifli, Augusli
Source :
Proceedings of the International Conference Computer-aided Design (9781424481927); 11/7/2010, p162-167, 6p
Publication Year :
2010

Details

Language :
English
ISBNs :
9781424481927
Database :
Complementary Index
Journal :
Proceedings of the International Conference Computer-aided Design (9781424481927)
Publication Type :
Conference
Accession number :
101490507