Back to Search Start Over

Cross-layer error resilience for robust systems.

Authors :
Leem, Larkhoon
Cho, Hyungmin
Lee, Hsiao-Heng
Kim, Young Moon
Li, Yanjing
Mitra, Subhasish
Source :
Proceedings of the International Conference Computer-aided Design (9781424481927); 11/7/2010, p177-180, 4p
Publication Year :
2010

Details

Language :
English
ISBNs :
9781424481927
Database :
Complementary Index
Journal :
Proceedings of the International Conference Computer-aided Design (9781424481927)
Publication Type :
Conference
Accession number :
101490510

Tools

Authors Abstract Subjects Details