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Defect-Related Luminescence in Undoped GaN Grown by HVPE.

Authors :
Reshchikov, M.A.
Usikov, A.
Helava, H.
Makarov, Yu.
Source :
Journal of Electronic Materials; May2015, Vol. 44 Issue 5, p1281-1286, 6p
Publication Year :
2015

Abstract

Hydride vapor phase epitaxy (HVPE) is used for the growth of low-defect GaN. We have grown undoped films on sapphire and investigated them using steady-state and time-resolved photoluminescence (PL). One of the dominant PL bands in high-quality GaN grown by HVPE is the green luminescence (GL) band with a maximum at 2.4 eV. This PL band can be easily recognized in time-resolved PL measurements due to its exponential decay even at low temperatures (<50 K), with a characteristic lifetime of 1-2 μs. As the temperature increases from 70 K to 280 K, the PL lifetime for the GL band increases by an order of magnitude. This unusual phenomenon can be explained on the assumption that the electron-capture coefficient for the GL-related defect decreases with temperature as T. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03615235
Volume :
44
Issue :
5
Database :
Complementary Index
Journal :
Journal of Electronic Materials
Publication Type :
Academic Journal
Accession number :
101697916
Full Text :
https://doi.org/10.1007/s11664-014-3540-4