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The Function of IR thermal imaging technology for device and circuit reliability research.
- Source :
- 2014 IEEE International Conference on Electron Devices & Solid-State Circuits; 2014, p1-2, 2p
- Publication Year :
- 2014
Details
- Language :
- English
- ISBNs :
- 9781479923342
- Database :
- Complementary Index
- Journal :
- 2014 IEEE International Conference on Electron Devices & Solid-State Circuits
- Publication Type :
- Conference
- Accession number :
- 102525314
- Full Text :
- https://doi.org/10.1109/EDSSC.2014.7061109