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Nanostructured Gold Thin Films: Young Modulus Measurement.

Authors :
Salvadori, M. C.
Vaz, A. R.
Melo, L. L.
Cattani, M.
Source :
Surface Review & Letters; Aug2003, Vol. 10 Issue 4, p571, 5p
Publication Year :
2003

Abstract

We have uniformly coated the cantilever of an atomic force microscope (AFM) with gold thin films. These films are nanostructured with thickness going from 19 to 62 nm. The resonance frequencies of this cantilever have been measured, before and after the Au coatings. Taking into account these frequencies and the vibrating beam theory, we determined the Young modulus of the Au films, obtaining E[sub 2] = 69.1 ± 2.6 GPa, i.e. about 12% lower than the respective bulk elastic modulus. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0218625X
Volume :
10
Issue :
4
Database :
Complementary Index
Journal :
Surface Review & Letters
Publication Type :
Academic Journal
Accession number :
10535600
Full Text :
https://doi.org/10.1142/S0218625X03005323