Normally-off GaN MIS-HEMT with improved thermal stability in DC and dynamic performance.

Details

Language :

English

ISBNs :

9781479962594

Database :

Complementary Index

Journal :

2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD)

Publication Type :

Conference

Accession number :

108573651

Full Text :

https://doi.org/10.1109/ISPSD.2015.7123427