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Disturbance-free BIST for loop characterization of DC-DC buck converters.
- Source :
- 2015 IEEE 33rd VLSI Test Symposium (VTS); 2015, p1-6, 6p
- Publication Year :
- 2015
Details
- Language :
- English
- ISBNs :
- 9781479975976
- Database :
- Complementary Index
- Journal :
- 2015 IEEE 33rd VLSI Test Symposium (VTS)
- Publication Type :
- Conference
- Accession number :
- 108574178
- Full Text :
- https://doi.org/10.1109/VTS.2015.7116250