What do we know about the defect types detected in conceptual models?

Details

Language :

English

ISBNs :

9781467366304

Database :

Complementary Index

Journal :

2015 IEEE 9th International Conference on Research Challenges in Information Science (RCIS)

Publication Type :

Conference

Accession number :

108574246

Full Text :

https://doi.org/10.1109/RCIS.2015.7128867