Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering.

Details

Language :

English

ISBNs :

9781467373623

Database :

Complementary Index

Journal :

2015 IEEE International Reliability Physics Symposium

Publication Type :

Conference

Accession number :

108579932

Full Text :

https://doi.org/10.1109/IRPS.2015.7112796