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On Resistive Networks of Constant-Power Devices.

Authors :
Simpson-Porco, John W.
Dorfler, Florian
Bullo, Francesco
Source :
IEEE Transactions on Circuits & Systems. Part II: Express Briefs; Aug2015, Vol. 62 Issue 8, p811-815, 5p
Publication Year :
2015

Abstract

This brief examines the behavior of DC circuits comprised of resistively interconnected constant-power devices (CPDs), as may arise in dc microgrids containing microsources and constant-power loads. We derive a sufficient condition for all operating points of the circuit to lie in a desirable set, where the average nodal voltage level is high, and nodal voltages are tightly clustered near one another. Our condition has the elegant physical interpretation that the ratio of resistive losses to total injected power should be small compared with a measure of network heterogeneity, as quantified by a ratio of conductance matrix eigenvalues. Perhaps surprisingly, the interplay between the circuit topology, branch conductances, and CPDs implicitly defines a nominal voltage level for the circuit, despite the explicit absence of voltage-regulated nodes. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
15497747
Volume :
62
Issue :
8
Database :
Complementary Index
Journal :
IEEE Transactions on Circuits & Systems. Part II: Express Briefs
Publication Type :
Academic Journal
Accession number :
108597536
Full Text :
https://doi.org/10.1109/TCSII.2015.2433537