Back to Search
Start Over
Performance study of side block oxide band gap engineered SONOS: A device simulation approach.
- Source :
- 2015 19th International Symposium on VLSI Design & Test; 2015, p1-4, 4p
- Publication Year :
- 2015
Details
- Language :
- English
- ISBNs :
- 9781479917433
- Database :
- Complementary Index
- Journal :
- 2015 19th International Symposium on VLSI Design & Test
- Publication Type :
- Conference
- Accession number :
- 110047401
- Full Text :
- https://doi.org/10.1109/ISVDAT.2015.7208146