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An investigation on the high temperature dependence of the HCI on NMOSFET transistor.
- Source :
- 2015 IEEE 22nd International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2015, p346-349, 4p
- Publication Year :
- 2015
Details
- Language :
- English
- ISBNs :
- 9781479999286
- Database :
- Complementary Index
- Journal :
- 2015 IEEE 22nd International Symposium on the Physical & Failure Analysis of Integrated Circuits
- Publication Type :
- Conference
- Accession number :
- 110056954
- Full Text :
- https://doi.org/10.1109/IPFA.2015.7224403