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Modeling a Set of Functional Test Sequences as a Single Sequence for Test Compaction.
- Source :
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Nov2015, Vol. 23 Issue 11, p2629-2638, 10p
- Publication Year :
- 2015
-
Abstract
- This paper describes a new model for a set of test sequences where a set $S$ is described by a single functional test sequence $T$ . Using this model, a procedure that compacts $T$ compacts all the sequences in $S$ simultaneously. This enhances the ability of the procedure to compact the set compared with procedures that consider the sequences in the set individually. It also allows the test sequences in $S$ to be redefined. If different sequences in $S$ have substantially different lengths, repartitioning $T$ allows new sequences with more uniform lengths to be obtained. After repartitioning, additional test compaction can be achieved. This paper describes a test compaction procedure that includes these operations based on the modeling of a set as a single sequence. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 10638210
- Volume :
- 23
- Issue :
- 11
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- Publication Type :
- Academic Journal
- Accession number :
- 110651489
- Full Text :
- https://doi.org/10.1109/TVLSI.2014.2370751