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Modeling a Set of Functional Test Sequences as a Single Sequence for Test Compaction.

Authors :
Pomeranz, Irith
Source :
IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Nov2015, Vol. 23 Issue 11, p2629-2638, 10p
Publication Year :
2015

Abstract

This paper describes a new model for a set of test sequences where a set $S$ is described by a single functional test sequence $T$ . Using this model, a procedure that compacts $T$ compacts all the sequences in $S$ simultaneously. This enhances the ability of the procedure to compact the set compared with procedures that consider the sequences in the set individually. It also allows the test sequences in $S$ to be redefined. If different sequences in $S$ have substantially different lengths, repartitioning $T$ allows new sequences with more uniform lengths to be obtained. After repartitioning, additional test compaction can be achieved. This paper describes a test compaction procedure that includes these operations based on the modeling of a set as a single sequence. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
10638210
Volume :
23
Issue :
11
Database :
Complementary Index
Journal :
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Publication Type :
Academic Journal
Accession number :
110651489
Full Text :
https://doi.org/10.1109/TVLSI.2014.2370751