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Fast Electron Ionization Effect in Multigap Pseudospark Discharge Under Nanosecond Pulsed Voltages.

Authors :
Zhang, Jia
Zhao, Junping
Zhang, Qiaogen
Source :
IEEE Transactions on Plasma Science; Nov2015, Vol. 43 Issue 11, p3921-3924, 4p
Publication Year :
2015

Abstract

In this paper, research studies on the breakdown progresses of multigap pseudospark discharge under nanosecond pulsed voltages are reported. The experimental results show great differences from dc voltages. The discharge mechanism of the pseudospark under nanosecond pulsed voltages has been successfully explained by the fast electron ionization effect. In each gap, collision ionizations caused by the fast electron start step by step, and development progresses are almost the same and approximately simultaneous until the main gap breaks down. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00933813
Volume :
43
Issue :
11
Database :
Complementary Index
Journal :
IEEE Transactions on Plasma Science
Publication Type :
Academic Journal
Accession number :
110859407
Full Text :
https://doi.org/10.1109/TPS.2015.2411693