Microscopic oxide defects causing BTI, RTN, and SILC on high-k FinFETs.

Details

Language :

English

ISBNs :

9781467376327

Database :

Complementary Index

Journal :

2015 12th IEEE International Conference on Advanced Video & Signal Based Surveillance (AVSS)

Publication Type :

Conference

Accession number :

111122248

Full Text :

https://doi.org/10.1109/SISPAD.2015.7292279