Mechanical simulation of stress engineering solutions in highly strained p-type FDSOI MOSFETs for 14-nm node and beyond.

Details

Language :

English

ISBNs :

9781467376327

Database :

Complementary Index

Journal :

2015 12th IEEE International Conference on Advanced Video & Signal Based Surveillance (AVSS)

Publication Type :

Conference

Accession number :

111122264

Full Text :

https://doi.org/10.1109/SISPAD.2015.7292295