Tangential-normal line testing for a nonconforming discretization of the transversal-electric Electric-Field Integral Equation for 2D conductors.

Details

Language :

English

ISBNs :

9781479977482

Database :

Complementary Index

Journal :

2015 2nd IEEE International Conference on Spatial Data Mining & Geographical Knowledge Services (ICSDM)

Publication Type :

Conference

Accession number :

111126129

Full Text :

https://doi.org/10.1109/ICEAA.2015.7297182