Electro-thermal characterization of 1.2 kV normally-on SiC JFETs under hard switch fault.

Details

Language :

English

ISBNs :

9781479985432

Database :

Complementary Index

Journal :

2015 IEEE MTT-S 2015 International Microwave Workshop Series on RF & Wireless Technologies for Biomedical & Healthcare Applications (IMWS-BIO)

Publication Type :

Conference

Accession number :

111128170

Full Text :

https://doi.org/10.1109/EPE.2015.7309054