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A Bayes Method for Assessing Large-Scale Electronic Equipment Reliability During External Field Test.

Authors :
Lu, Lei
Yang, Jiang-pin
Wang, Min
Source :
Proceedings of the 6th International Asia Conference on Industrial Engineering & Management Innovation: Core Theory & Applications of Industrial Engineering (Volume 1); 2016, p237-244, 8p
Publication Year :
2016

Details

Language :
English
ISBNs :
9789462391475
Database :
Complementary Index
Journal :
Proceedings of the 6th International Asia Conference on Industrial Engineering & Management Innovation: Core Theory & Applications of Industrial Engineering (Volume 1)
Publication Type :
Book
Accession number :
111463115
Full Text :
https://doi.org/10.2991/978-94-6239-148-2_23